Structured Illumination Microscopy (SIM) Literature References

Although technically not a superresolution technique, conventional structured illumination microscopy (SIM; pioneered by Professor Tony Wilson) is useful for optical sectioning and forms the physical basis for higher resolution techniques. SIM relies on a grid pattern residing in one of the illumination apertures to generate a sinusoidal excitation wavefield that can be used to extract information from the image focal plane (thus rejecting out-of-focus blur). Several commercial implementations are available for standard widefield microscopes.
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