4Pi Superresolution Microscopy Literature References

Taking advantage of dual juxtaposed objectives, 4Pi microscopy is able to converge the excitation illumination at a common focal plane to generate constructive interference that reduces the axial resolution to a value near 100 nanometers. The resulting point-spread function is approximately 1.5-fold sharper in the lateral dimensions and nearly 7-fold sharper in the axial dimension compared to laser scanning confocal microscopy. 4Pi microscopy involves scanning the specimen pixel-by-pixel, similar to confocal, but can also be implemented with multi-photon laser sources and CCD camera systems.

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4Pi Superresolution Microscopy