Near-Field Scanning Optical Microscopy Literature References

Near-field scanning microscopy techniques probe the specimen within the region having a radius much shorter than the illumination wavelength. These instruments achieve superresolution imaging by exploiting the unique properties of evanescent waves and can produce resolution that is limited only the physical size of the probe aperture (less than 20 nanometers). Contrast is generated by refractive index, chemical structure, local stress, and/or fluorescence emission properties of the specimen.

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Near-Field Scanning (NSOM)