Saturated Structured Illumination Microscopy Literature References

Saturated pattern excitation microscopy (SPEM) and saturated structured illumination microscopy (SSIM) are non-linear methods that deplete the fluorophore ground state by saturated excitation to generate a sinusoidal emission pattern that is recorded on an area-array CCD detector. The saturated excitation illumination produces narrow line-shaped dark regions in the zero nodes that are surrounded by high levels of fluorescence signal to generate a negative imprint of the features being imaged. Information about the specimen is retrieved mathematically during post-acquisition processing.

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Saturated Structured Illumination