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Interactive Java Tutorials
Nikon MicroscopyU interactive Java and Flash tutorials are designed to simplify and explain complex topics in microscopy, optics, digital imaging, and photomicrography. Each tutorial explores an individual topic and takes advantage of the powerful Java technology to create interactive features that allow the visitor to change parameters and observe how this affects the phenomenon being studied. Use the links below to navigate to interactive Java tutorials of interest.
Common Optical Aberrations
- Astigmatism
An off-axis aberration manifested as a point appearing to be a line or ellipse.
- Chromatic Aberration
Wavelength-dependent artifact occurring due to refractive index variations.
- Field Curvature
Common aberration caused by the spherical surface of lens elements.
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- Geometrical Distortion
Termed pincushion or barrel, geometrical distortion often occurs in stereomicroscopy.
- Coverslip Correction Collars
This tutorial demonstrates how internal lens elements in a high numerical aperture dry objective may be adjusted using a correction collar to correct for spherical aberration and other artifacts caused by variations in coverslip thickness.
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The Microscope Optical Train
Differential Interference Contrast Microscopy
Phase Contrast Microscopy
Fluorescence Microscopy
Confocal Microscopy
- Laser Scanning Confocal Microscopy
A virtual microscope tutorial featuring a wide variety of specimens. Examine the effects of altering gain, scanning speeds, axial focus, brightness, and pinhole size.
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Digital Imaging
- CCD Signal-To-Noise Ratio
Signal-to-noise represents the ratio of the measured light signal to the combined noise. The three primary sources are photon noise, dark noise, and read noise.
- CCD Noise Sources
A review of the types of noise sources associated with digital imaging.
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Miscellaneous Tutorials
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