Fundamental Concepts in Superresolution Microscopy

Despite the advantages of traditional fluorescence microscopy, the technique is hampered in ultrastructural investigations due to the resolution limit set by the diffraction of light, which restricts the amount of information that can be captured with standard objectives. In the past few years, a number of novel approaches have been employed to circumvent the diffraction limit, including near-field scanning optical microscopy (NSOM), stimulated emission depletion microscopy (STED), stochastic optical reconstruction microscopy (STORM) and structured illumination microscopy (SIM). These techniques have all achieved improved lateral (x-y) resolution down to tens of nanometers, more than an order of magnitude beneath that imposed by the diffraction limit, but each method has a unique set of limitations.
Review Articles
Interactive Tutorials
Selected Literature References

Contributing Authors

Joel S. Silfies and Stanley A. Schwartz - Nikon Instruments, Inc., 1300 Walt Whitman Road, Melville, New York, 11747.

Sunita Martini, Stephen P. Price, Alex B. Coker, and Michael W. Davidson - National High Magnetic Field Laboratory, 1800 East Paul Dirac Dr., The Florida State University, Tallahassee, Florida, 32310.